Reliability of AIGaN-based deep UV LEDs on sapphire [6134-23]

Reliability of AIGaN-based deep UV LEDs on sapphire [6134-23]

Author(s):

Shatalov, M. ( Univ. of South Carolina (USA) )

Gong, Z. ( Univ. of South Carolina (USA) )

Gaevski, M. ( Univ. of South Carolina (USA) )

Wu, S. ( Univ. of South Carolina (USA) )

Sun, W. ( Univ. of South Carolina (USA) )

Adivarahan, V. ( Univ. of South Carolina (USA) )

Khan, M. A. ( Univ. of South Carolina (USA) )

2 more

Publication title:

Light-Emitting Diodes: Research, Manufacturing, and Applications X

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6134

Pub. Year:

2006

Page(from):

61340P

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461766 [0819461768]

Language:

English

Call no.:

P63600/6134

Type:

Conference Proceedings

Details

TDL ID:	ZA00016168
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Light-Emitting Diodes: Research, Manufacturing, and Applications
Conf. info. (Number):	2006 : 10th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.01.25-2006.01.26

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