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Surtace spatial profiles of defects in GaN (Invited Paper) [6121-14]

Author(s):
Johnstone, D. K. ( SEMETROL (USA) )
Akarca-Biyikli S ( Virginia Commonwealth Univ. (USA) )
Xie, J. ( Virginia Commonwealth Univ. (USA) )
Fu, Y. ( Virginia Commonwealth Univ. (USA) )
Litton, C. W. ( Air Force Research Lab. (USA) )
Morkoc H ( Virginia Commonwealth Univ. (USA) )
1 more
Publication title:
Gallium Nitride Materials and Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6121
Pub. Year:
2006
Page(from):
61210N
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461636 [0819461636]
Language:
English
Call no.:
P63600/6121
Type:
Conference Proceedings

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