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Perspective of MEMS-based raster scanning display and its requirements for success (Invited Paper) [6114-05]

Author(s):
  • Park, Y.-H. ( Samsung Advanced Institute of Technology (South Korea) )
  • Lee, J.-H. ( Samsung Advanced Institute of Technology (South Korea) )
  • Shin, S.-H. ( Samsung Advanced Institute of Technology (South Korea) )
  • Sunu, J. ( Samsung Advanced Institute of Technology (South Korea) )
Publication title:
MOEMS Display, Imaging, and Miniaturized Microsystems IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6114
Pub. Year:
2006
Page(from):
611403
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461568 [0819461563]
Language:
English
Call no.:
P63600/6114
Type:
Conference Proceedings

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