Reliable high power diode lasers: thermo-mechanical fatigue aspects [6104-02]

Reliable high power diode lasers: thermo-mechanical fatigue aspects [6104-02]

Author(s):

Klumel, G. ( SCD-Semiconductor Devices (Israel) )
Gridish, Y. ( SCD-Semiconductor Devices (Israel) )
Szafranek, I. ( SCD-Semiconductor Devices (Israel) )
Karni, Y. ( SCD-Semiconductor Devices (Israel) )

Publication title:

High-Power Diode Laser Technology and Applications IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6104

Pub. Year:

2006

Page(from):

610402

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461469 [0819461466]

Language:

English

Call no.:

P63600/6104

Type:

Conference Proceedings

Details

TDL ID:	ZA00016138
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : High-power diode laser technology and applications
Conf. info. (Number):	2006 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.01.23-2006.01.25

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