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Optimum conditions for high-quality 3D reconstruction in confocal scanning microscopy [6090-32]

Author(s):
  • Kim, T. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Lee, S. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Gweon, D. G. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Seo, J. ( Samsung Electronics Co., Ltd. (South Korea) )
Publication title:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6090
Pub. Year:
2006
Page(from):
60900W
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819461322 [0819461326]
Language:
English
Call no.:
P63600/6090
Type:
Conference Proceedings

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