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Development of the random-retardation-encoding anti-counterfeiting technology

Author(s):
  • Huang, W. J. ( Industrial Technology Research Institute (Taiwan) )
  • Tsai, C. H. ( Industrial Technology Research Institute (Taiwan) )
  • Chen, T. J. ( Industrial Technology Research Institute (Taiwan) )
  • Kuan, M. ( Industrial Technology Research Institute (Taiwan) )
  • Wen, C. H.
Publication title:
Optical Security and Counterfeit Deterrence Techniques VI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6075
Pub. Year:
2006
Page(from):
60750H
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461155 [0819461156]
Language:
English
Call no.:
P63600/6075
Type:
Conference Proceedings

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