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Adaptive sampling for atomic force microscopy [6065-13]

Author(s):
Publication title:
Computational imaging IV : 16-18 January, 2006, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6065
Pub. Year:
2006
Page(from):
60650D
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461056 [0819461059]
Language:
English
Call no.:
P63600/6065
Type:
Conference Proceedings

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