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Design and optimazation of electronic speckle pattern interforemeters to evaluate three-dimensional displacements (XXV CIO Anniversary Paper) [6046-90]

Author(s):
Publication title:
Fifth symposium optics in industry : 8-9 September 2005, Santiago de Queretaro, Mexico
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6046
Pub. Year:
2006
Page(from):
60462I
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460783 [0819460788]
Language:
English
Call no.:
P63600/6046
Type:
Conference Proceedings

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