Blank Cover Image

Load cell strain measurement in load cell using opto-electronics methods [6046-79]

Author(s):
Publication title:
Fifth symposium optics in industry : 8-9 September 2005, Santiago de Queretaro, Mexico
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6046
Pub. Year:
2006
Page(from):
604627
Page(to):
604627
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460783 [0819460788]
Language:
English
Call no.:
P63600/6046
Type:
Conference Proceedings

Similar Items:

Shlyagin,M.G., Swart,P.L., Miridonov,S.V., Chtcherbakov,A.A., Borbon,I.Marquez, Spirin,V.V.

SPIE-The International Society for Optical Engineering

Rodriguez, J.R. Alarcon, Fadrique, F. Martinez, Klinkrad, H.

ESA Publications Division

Rodriguez-Vera, R., Rayas, A. J., Martinez, A., Rodriguez, O., Yanez, G. I.

SPIE - The International Society of Optical Engineering

Rayas, A. J., Rodriguez-Vera, R., Martinez, A.

SPIE - The International Society of Optical Engineering

Borecki, M., Wrzosek, P., Kruszewski, J.

SPIE - The International Society of Optical Engineering

Guerrero-Viramontes, A. J., Rodriguez-Cervantes, V., Moreno H., D., Barrientos, B., Mendoza-Santoyo, F.

SPIE - The International Society of Optical Engineering

Rodriguez, A. A., Roman, J. C., Cruz, H., Orozco-Arellanes, J. MO, Ortega-Martinez, R.

SPIE - The International Society of Optical Engineering

Molero, F., Alados-Arboledas, L., Pujadas, M., Alcantara, A., Cacharro, V., Estelles, V., Olmo, F.J., Martinez-Lozano, …

SPIE - The International Society of Optical Engineering

5 Conference Proceedings Block copolymers for opto-electronics

Sun, S.-S., Fan, Z., Wang, Y., Taft, C., Haliburton, J.H., Maaref, S., Ledbetter, A.J., Bonner, C.E.

SPIE - The International Society of Optical Engineering

Coca,F.Camacho-de, Martinez,B., Gilabert,M.A., Melia,J.

SPIE-The International Society for Optical Engineering

Serrano-Guzman M. F., Padilla I., Rodriguez R.

SPIE - The International Society of Optical Engineering

Uguina, M. A., Ovejero, G., Grieken, R. van, Serrano, D. P., Camacho, M.

Elsevier

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12