Characteriszing charge trapping in microwave transistors [6035-31]

Characteriszing charge trapping in microwave transistors [6035-31]

Author(s):

Rathmell J. G ( The Univ. of Sydney (Australia) )
Parker A. E ( Macquiarie Univ. (Australia) )

Publication title:

Microelectronics: Design, Technology, and Packaging II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6035

Pub. Year:

2006

Page(from):

60350U

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460660 [0819460664]

Language:

English

Call no.:

P63600/6035

Type:

Conference Proceedings

Details

TDL ID:	ZA00016070
Series ID:	PA00000029
Conf. info. (Name):	Smart Materials, Nano-, and Micro- Smart Systems : Microelectronics
Conf. info. (Number):	2005 : 2nd
Conf. info. (Venue):	Brisbane, Australia
Conf. info. (Date):	2005.12.12-2005.12.14

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