Blank Cover Image

Fourier transform profilometry based on a fringe pattern with two frequency components [6027-54]

Author(s):
Publication title:
ICO20: Optical Information Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6027
Pub. Year:
2006
Pt.:
1
Page(from):
60271I
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460585 [0819460583]
Language:
English
Call no.:
P63600/6027
Type:
Conference Proceedings

Similar Items:

Chen W., Su X., Cao Y., Zhang Q., Xiang L.

SPIE - The International Society of Optical Engineering

Su,X., Chen,W.

SPIE-The International Society for Optical Engineering

Chen W., Su X., Cao Y., Zhang Q., Xiang L.

SPIE - The International Society of Optical Engineering

Su, W. -H., Hsu, Y. -L., Kuo, C. -Y., Chen, H. -M., Su, W. -C., Yin, S.

SPIE - The International Society of Optical Engineering

Cao, Y., Su, X., Xiang, L., Chen, W., Zhang, Q.

SPIE - The International Society of Optical Engineering

X. Su, W. Zhao, Q. Zhang, L. Xiang

Society of Photo-optical Instrumentation Engineers

Su,X., Xue,L.

SPIE-The International Society for Optical Engineering

Zhang, Q., Su, X., Xiang, L., Cao, Y., Chen, W.

SPIE - The International Society of Optical Engineering

Su,X.-Y., Su,L.-K., Li,W.-S.

SPIE - The International Society for Optical Engineering

Zhang, Q., Su, X., Chen, W., Cao, Y., Xiang, L.

SPIE - The International Society of Optical Engineering

Su, X.Y., Cao, Y.P., Xiang, L.Q., Chen, W.J.

SPIE-The International Society for Optical Engineering

Chen, W., Su, X., Cao, Y., Xiang, L., Zhang, Q.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12