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A novel method for measuring the thickness of optical wave plate [6024-47]

Author(s):
  • Feng W.
  • Lin L. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Publication title:
ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6024
Pub. Year:
2005
Page(from):
60241B
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460554 [0819460559]
Language:
English
Call no.:
P63600/6024
Type:
Conference Proceedings

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