Analysis of various correction factors for MTF measurement with a square object [6024-32]

Analysis of various correction factors for MTF measurement with a square object [6024-32]

Author(s):

Hong S. M.

Jo J. H. ( Hannam Univ. (South Korea) )

Lee I. W. ( Korea Research Institute of Standards and Science (South Korea) )

2 more

Publication title:

ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6024

Pub. Year:

2005

Page(from):

60240W

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460554 [0819460559]

Language:

English

Call no.:

P63600/6024

Type:

Conference Proceedings

Details

TDL ID:	ZA00016059
Series ID:	PA00000029
Conf. info. (Name):	ICO
Conf. info. (Number):	2005 : 20th
Conf. info. (Venue):	Changchun, China
Conf. info. (Date):	2005.08.21-2005.08.26

Similar Items:

1 Conference Proceedings Fabrication of MTF measurement system for a mobile phone lens using multi-square objects S. M. Hong, J. H. Jo, H. Y. Lee, H. S. Yang, Y. W. Lee Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings Polychromatic modulation transfer function analysis of color LCD Song, J.S., Lee, Y.W., Cho, H.M., Park, S.N., Lee, I.W., Jo, J.H. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Measurement of the birefrigence distribution in high resolution laser scanning lenses [6024-39] Cho H. S., Lee Y. W., Hwangbo C. K., Lee J. U. SPIE - The International Society of Optical Engineering	8 Conference Proceedings New synthetic evaluation of color display using polychromatic MTF Song, J.S., Lee, Y.W., Lee, I.W., Jo, J.H., Lee, W.Y., Lim, T.K. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Evaluation of color display by polychromatic MTF Song, J.S., Lee, Y.W., Lee, I.W., Jo, J.H., Chang, S. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Statistical analysis of CD-SEM measurement and process control in the indistinguishable multi-process patterns [6152-100] Yang, D. S., Jung, M. H., Lee, Y. M., Koh, C. W., Yeo, G. S., Woo, S. G., Cho, H. K., Moon, J. T. SPIE - The International Society of Optical Engineering
4 Conference Proceedings MTF measurement for optical engine of CRT rear-projection HDTV Song, J.S., Lee, Y.W., Lee, I.W., Jo, J.H., Lee, W.Y., Lim, T.K. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Equipment for Real Time MTF Testing of Copier and Fax Lenses, Cho,H.M., Lee,Y.W., Chung,Y.B., Lee,I.W., Kim,T.H., Choe,O.S. SPIE-The International Society for Optical Engineering
5 Conference Proceedings MTF measurement of LCDs by a linear CCD imager: I. Monochrome case Kim,T.H., Choe,O.S., Lee,Y.W., Cho,H.M., Lee,I.W. SPIE-The International Society for Optical Engineering	11 Conference Proceedings Assessments on process parameters' influences to the proximity correction Lee, E.-M., Lee, S.-W., Lee, D.-Y., Choi, S.-H., Park, J.-O., Jung, S.-G., Yeo, G.-S., Lee, J.-H., Cho, H.-K., Han, … SPIE - The International Society of Optical Engineering
6 Conference Proceedings Radiation dose measurement for various parameters in MDCT C.-L. Lee, H.-J. Kim, S. S. Jeon, H.-M. Cho, S. R. Nam Society of Photo-optical Instrumentation Engineers	12 Conference Proceedings On the Numerical Accuracy of Wave Induced Structural Stresses of VLFs for Various Hydroelastic Analysis Methods S. Y. Hong, J. H. Kyoung, B. W. Kim, S. K. Cho American Society of Mechanical Engineers

1

2

3

4

5

6

7

8

9

10

11

12