Imaging ellipsometry combined with surface for real-time biospecific interaction analysis [6008-51]

Imaging ellipsometry combined with surface for real-time biospecific interaction analysis [6008-51]

Author(s):

Chegal W.
Cho H. M.
Cho Y. J. ( Korea Research Institute of Standards and Science (South Korea) )
Kim Y. P.
Kim H. S. ( Korea Advanced Institute of Science and Technology (South Korea) )

Publication title:

Nanosensing: Materials and Devices II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6008

Pub. Year:

2005

Page(from):

60081G

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460325 [081946032X]

Language:

English

Call no.:

P63600/6008

Type:

Conference Proceedings

Details

TDL ID:	ZA00016043
Series ID:	PA00000029
Conf. info. (Name):	Optics East : Nanosensing
Conf. info. (Number):	2005 : 2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2005.10.23-2005.10.26

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