Blank Cover Image

Photo- and current-induced crystallization of optical and electrical memory in phase change materials [5966-06]

Author(s):
  • Okuda, M. ( Okuda Technical Office (Japan) )
  • Inaba, H. ( Osaka Prefecture Univ. (Japan) )
  • Usuda, S. ( Osaka Prefectural College of Technology (Japan) )
Publication title:
Seventh International Symposium on Optical Storage (ISOS 2005)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5966
Pub. Year:
2005
Page(from):
596606
Page(to):
596606
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459848 [0819459844]
Language:
English
Call no.:
P63600/5966
Type:
Conference Proceedings

Similar Items:

Okuda, M., Inaba, H., Usuda, S.

SPIE-The International Society for Optical Engineering

Liberman, V., Bloomstein, T.M., Rothschild, M., Palmacci, S.T., Sedlacek, J.H.C., Grenville, A.

SPIE - The International Society of Optical Engineering

Okuda, Masahiro, Inaba, Hirokazu, Usuda, Shouji

Materials Research Society

Okino,Y., Kubo,T., Okuda,M., Hasegawa,S.

SPIE-The International Society for Optical Engineering

Usuda, S., Inoue, S., Itou, S., Inaba, H., Jiang, F., Okuda, M., Chen, Y. H.

SPIE - The International Society of Optical Engineering

Qin, L., Ma, J., Zhang, J., Pan, L., Deng, M.

SPIE - The International Society of Optical Engineering

Usuda,S., Okuda,M.

SPIE-The International Society for Optical Engineering

Usuda, S., Okuda, M., Inaba, H.

SPIE-The International Society for Optical Engineering

Zhang, G., Gu, D., Jiang, X., Chen, Q., Gan, F.

SPIE - The International Society of Optical Engineering

Okuda,M., Matsushita,T.

SPIE-The International Society for Optical Engineering

Okino, Y., Irie, M., Kubo, T., Okuda, M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12