Spatially resolved spectroscopy for non-uniform thin film coatings: comparison of two dedicated set-ups [5965-70]

Author(s):

Krasilnikova, A.

Piegari, A. ( ENEA (Italy) )

Dami, M. ( Galileo Avionica S.p.A. (Italy) )

Abel-Tiberini, L.

Lemarquis, F.

Lequime, M. ( Institut Fresnel (France) )

1 more

Publication title:

Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5965

Pub. Year:

2005

Page(from):

59651V

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459831 [0819459836]

Language:

English

Call no.:

P63600/5965

Type:

Conference Proceedings