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Failure analysis of PC MCT caused by current [5964-46]

Author(s):
Liu, D.
Wu, L. ( Shanghai Institute of Technical Physics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) )
Yuan, Y.
Zhang, L.
Jin, X.
Gong, H. ( Shanghai Institute of Technical Physics, CAS (China) )
1 more
Publication title:
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5964
Pub. Year:
2005
Page(from):
596415
Page(to):
596415
Pages:
1
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459824 [0819459828]
Language:
English
Call no.:
P63600/5964
Type:
Conference Proceedings

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