Wavelet-based Bayesian denoising using Bernoulli-Gaussian mixture model [5960-34]

Wavelet-based Bayesian denoising using Bernoulli-Gaussian mixture model [5960-34]

Author(s):

Eom, I. K. ( Miryang National Univ. (South Korea) )
Kim, Y. S. ( Pusan National Univ. (South Korea) )

Publication title:

Visual Communications and Image Processing 2005

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5960

Pub. Year:

2005

Pt.:

1

Page(from):

316

Page(to):

324

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459763 [0819459763]

Language:

English

Call no.:

P63600/5960

Type:

Conference Proceedings

Details

TDL ID:	ZA00015997
Series ID:	PA00000029
Conf. info. (Name):	Visual communications and image processing
Conf. info. (Number):	2005
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2005.07.12-2005.07.15

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