Advanced metrology an essential support for the surface finishing of high performance x-rap optics [5921-01]
- Author(s):
Siewert, F. Lammert, H. Noll, T. Schlegel, T. Zeschke, T. ( BESSY (Germany) ) Hansel, T. Nickel, A. Schindler, A. ( Leibniz Institute for Surface Modification e.V. (Germany) ) Grubert, B. Schlewitt, C. ( Moeller-Wedel Optical GmbH (Germany) ) - Publication title:
- Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5921
- Pub. Year:
- 2005
- Page(from):
- 592101
- Page(to):
- 592101
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459268 [0819459267]
- Language:
- English
- Call no.:
- P63600/5921
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Reactive ion beam etching:a fabrication process for the figuring of precision aspheric optical surfaces in fused silica
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Proposal for a universal test mirror for characterization of slope measuring instruments
Society of Photo-optical Instrumentation Engineers |
3
Conference Proceedings
Ion beam figuring of SiC mirrors provides ultimate WFE performances for any type of telescope
SPIE - The International Society for Optical Engineering |
Plenum Press |
4
Conference Proceedings
Synchrotron radiation mirror prototype made of monocrystalline tungsten [5965-76]
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
First report on a European round robin for slope measuring profilers [5921-20]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Combined advanced finishing and UV-laser conditioning for producing UV-damage-resistant fused-silica optics
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
High Precision Finishing Technique of Sapphire Substrate Surface for Photoconducting Device
Trans Tech Publications |