Projected fringe profilometry using holographic techniques for large-scale measurements (Invited Paper) [5911-26]

Projected fringe profilometry using holographic techniques for large-scale measurements (Invited Paper) [5911-26]

Author(s):

Su, W.-H.
Chen, W. -J.
Kao, J.
Huang, C.-J ( National Sun Yat-Sen Univ. (Taiwan) )

Publication title:

Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5911

Pub. Year:

2005

Page(from):

59110Q

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459169 [081945916X]

Language:

English

Call no.:

P63600/5911

Type:

Conference Proceedings

Details

TDL ID:	ZA00015949
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Photorefractive Fiber and Crystal Devices
Conf. info. (Number):	2005 : 11th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.07.31-2005.08.01

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