Correlation identification of film reflecting holographic marks [5908-54]
- Author(s):
- Muravsky, L. I. ( Karpenko Physic-Mechanical Institute (Ukraine) )
- Kostyukevych, S. O. ( V. Lashkaryov Institute of Semiconductor Physics (Ukraine) )
- Fitio, V. M. ( National Univ. Lvivska Polytechnica (Ukraine) )
- Voronyak, T. I. ( Karpenko Physic-Mechanical Institute (Ukraine) )
- Shepeliavyi, P. E. ( V. Lashkaryov Institute of Semiconductor Physics (Ukraine) )
- Publication title:
- Optical Information Systems III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5908
- Pub. Year:
- 2005
- Page(from):
- 59081J
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459138 [0819459135]
- Language:
- English
- Call no.:
- P63600/5908
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Transformed phase mask in a hybrid joint transform correlator for security verification
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Comparative analysis of optical and hybrid joint transform correlators for security applications
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Investigation of a joint transform correlator characteristics for binary pattern recognition
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Performance of optical speckle displacement technique near-stress concentrators
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Investigation of the process for manufacturing optoelectronic devices using nonorganic photoresists
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Identification of a random binary phase mask and its fragments with a joint transform correlator
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Separation of random phase mask in optical correlator for security verification
SPIE |