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Diffraction analysis of pupil-mapping systems for planet finding [5905-43]

Author(s):
Vanderbei, R. J. ( Princeton Univ. (USA) )  
Publication title:
Techniques and instrumentation for detection of exoplanets II : 2-4 August 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5905
Pub. Year:
2005
Page(from):
590517
Page(to):
590518
Pages:
2
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459107 [0819459100]
Language:
English
Call no.:
P63600/5905
Type:
Conference Proceedings

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