Specimen-induced aberrations and adaptive optics for microscopy [5894-03]

Specimen-induced aberrations and adaptive optics for microscopy [5894-03]

Author(s):

Booth, M. J.
Schwertner, M.
Wilson, T. ( Univ. of Oxford (United Kingdom) )

Publication title:

Advanced wavefront control : methods, devices, and applications III : 31 July-2 August 2005, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5894

Pub. Year:

2005

Page(from):

589403

Page(to):

599403

Pages:

10001

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458995 [0819458996]

Language:

English

Call no.:

P63600/5894

Type:

Conference Proceedings

Details

TDL ID:	ZA00015933
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Advanced wavefront control
Conf. info. (Number):	2005 : 3rd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.07.31-2005.08.02

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