Multi-angle generalized ellipsometry of anisotropic oprical structures [5888-08]

Multi-angle generalized ellipsometry of anisotropic oprical structures [5888-08]

Author(s):

Beaudry, N. A.
Zhao, Y.
Chipman, R. ( College of Optical Sciences/ Univ. of Arizona (USA) )

Publication title:

Polarization science and remote sensing II : 2-4 August 2005, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5888

Pub. Year:

2005

Page(from):

588808

Page(to):

588808

Pages:

1

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458933 [0819458937]

Language:

English

Call no.:

P63600/5888

Type:

Conference Proceedings

Details

TDL ID:	ZA00015927
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Polarization science and remote sensing
Conf. info. (Number):	2005 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.08.02-2005.08.04

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