Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern [5880-03]
- Author(s):
- Yoshizawa, T.
- Yamamoto, M.
- Ikeda, T. ( Univ. of Agriculture and Technology (Japan) )
- Publication title:
- Optical Diagnostics
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5880
- Pub. Year:
- 2005
- Page(from):
- 588003
- Page(to):
- 588003
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458858 [0819458856]
- Language:
- English
- Call no.:
- P63600/5880
- Type:
- Conference Proceedings
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