Design and test of a differential scanning stage system for a x-ray nanoprobe instrument (Invited Paper) [5877-14]
- Author(s):
Shu, D. Maser, J. Halt, M. Lai, B. Vogt. S. Wang, Y. Preissner, C. ( Argonne National Lab (USA); ) Han, Y. ( Argonne National Lab. (USA) and Illinois Institute of Technology (USA); ) B. Tieman, Winarski, R. ( Argonne National Lab. (USA); ) Smalyanitskiy, A ( Argonne National Lab. (USA) and Illinois Institute of Technology (USA); ) Stephenson, G. B. ( Argonne National Lab. (USA) ) - Publication title:
- Optomechanics 2005 : 3-4 August 2005, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5877
- Pub. Year:
- 2005
- Page(from):
- 58770E
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458827 [0819458821]
- Language:
- English
- Call no.:
- P63600/5877
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
X-ray tomography system, automation, and remote access at beamline 2-BM of the Advanced Photon Source (Invited Paper) [6318-20]
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Precision mechanical design of an UHV-compatible artificial channel-cut x-ray monochromator
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE |
9
Conference Proceedings
Combined nanoprobes for scanning probe microscopy: laser technology for processing and testing
Society of Photo-optical Instrumentation Engineers |
4
Conference Proceedings
Vibration diagnosis and remediation design for an x-ray optics stitching interferometer system
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Mechanical design of a high-resolution x-ray powder diffractometer at the Advanced Photon Source
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Parameter identification for joint elements in a revolute-joint detector manipulator [5877-18]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |