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Retrace error evaluation on a figure-measuring interferometer [5869-35]

Author(s):
Publication title:
Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5869
Pub. Year:
2005
Page(from):
58690V
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458742 [0819458740]
Language:
English
Call no.:
P63600/5869
Type:
Conference Proceedings

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