Blank Cover Image

Measurement advances for micro-refractive fabrication (Invited Paper) [5858-25]

Author(s):
Publication title:
Nano- and Micro-Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5858
Pub. Year:
2005
Page(from):
58580P
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458582 [0819458589]
Language:
English
Call no.:
P63600/5858
Type:
Conference Proceedings

Similar Items:

Davies, A.D., Bergner, B.C., Gardner, N.W.

SPIE-The International Society for Optical Engineering

Gardner, N., Randolph, T., Davies, A.

SPIE - The International Society of Optical Engineering

Karodkar, D., Gardner, N., Bergner, B.C., Davies, A.

SPIE - The International Society of Optical Engineering

Angelsky, O. V., Maksimyak, P. P.

SPIE - The International Society of Optical Engineering

Medicus, K. M., Karodkar, D., Bergner, B. C., Gardner, N., Davies, A.

SPIE-The International Society for Optical Engineering

Grillet C., Freeman D., Luther-davies B., Madden S., Smith C., Magi E., McPhedran R., Moss D. J, Steel M. J, Eggleton B. …

SPIE - The International Society of Optical Engineering

Bergner, B.C., Davies, A.

SPIE - The International Society of Optical Engineering

Herman, W.N., Chen, W.-Y., Kim, Y., Hutchinson, G., Cao, W.L., Leng, Y., Yun, V., Liang, H., Peng, Y.-H., Du, M., Lucas, …

SPIE - The International Society of Optical Engineering

Davies, M. A., Evans, C. J., Patterson, S. R., Vohra, R. R., Bergner, B. C.

SPIE-The International Society for Optical Engineering

Tormen, M., Carpentiero, A., Ferrai, E., Cabrini, S., Cojoc, D., Di Fabrizio, E.

SPIE - The International Society of Optical Engineering

Kujawinska, M., Gorecki, C., Ottevaere, H., Szczepanski, P., Thienpont, H.

SPIE - The International Society of Optical Engineering

Nener, B. D., Fowkes, N.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12