Blank Cover Image

Absolute distance measurement using femtosecond laser [5858-23]

Author(s):
Publication title:
Nano- and Micro-Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5858
Pub. Year:
2005
Page(from):
58580N
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458582 [0819458589]
Language:
English
Call no.:
P63600/5858
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Two-point diffraction interferometer for absolute distance measurement

Kim, S.-W., Rhee, H.-G., Joo, J.-Y., Kim, Y.-J.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings High-precision long-distance measurement using a frequency comb of a femtosecond mode-locked laser

Matsumoto, H., Minoshima, K., Telada, S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser [6292-25]

Jin, J., Kim, Y. -J., Kang, C. S., Kim, S. -W.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Application to optically controlled spatial light modulator using organic photorefractive composite

Joo, W.-J., Kim, N.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Surface metrology of silicon wafers using a femtosecond pulse laser

T. Kwon, K.-N. Joo, S.-W. Kim

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Three-dimensional microfabrication using two-photon absorption by femtosecond laser

Yi, S.W., Lee, S.K., Kong, H.J., Yang, D.-Y., Park, S., Lim, T., Kim, R.H., Lee, K.-S.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Absolute distance measurements using point-diffracted spherical waves [6293-26]

Chu J., Kim S.-W.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Absolute distance interferometry using diode lasers

K. Meiners-Hagen, A. Abou-Zeid, L. Hartmann

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Absolute distance measurement with the MSTAR sensor

Lay, O. P., Dubovitsky, S., Peters, R. D., Burger, J., Ahn, S.-W., Steier, W. H., Fetterman, H. R., Chang, Y.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Design and Characterization of 50W Switch Mode Power Supply Using Normally-On SiC JFET

I.H. Kang, S.J. Joo, W. Bahng, S.C. Kim, N.K. Kim

Trans Tech Publications
6 Conference Proceedings Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples [6292-24]

Jao, K. -N., Kim, S. -W.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Absolute distance metrology for space interferometers [5879-23]

Swinkeis, B. L., Latoui, A., Wielders, A. A., Braat, J. J. M.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12