Blank Cover Image

Development of an optical interferometer for micro-components inspection [5852-56]

Author(s):
Publication title:
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5852
Pub. Year:
2005
Pt.:
1
Page(from):
345
Page(to):
351
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458520 [081945852X]
Language:
English
Call no.:
P63600/5852
Type:
Conference Proceedings

Similar Items:

Miao, H., Quan, C., Tay, C. J., Wu, X. P.

SPIE - The International Society of Optical Engineering

Thakur, M., Quan, C., Tay, C. J.

SPIE - The International Society of Optical Engineering

C. J. Tay, C. Quan, S. H. Wang

Society of Photo-optical Instrumentation Engineers

He,X.Y., Kang,X., Quan,C., Tay,C.J., Wang,S.H., Shang,H.M.

SPIE-The International Society for Optical Engineering

Fu, Y., Tay, C. J., Quan, C., Chen, L. J.

SPIE - The International Society of Optical Engineering

Shang,H.M., Toh,S.L., Fu,Y., Quan,C., Tay,C.J.

SPIE-The International Society for Optical Engineering

Li, M., Quan, C., Tay, C. J., Reading, I., Wang, S.

SPIE - The International Society of Optical Engineering

Wang,S.H., Tay,C.J., Quan,C., shang,H.M.

SPIE-The International Society for Optical Engineering

Y. Fu, H. Shi, C. Quan, C. J. Tay

Society of Photo-optical Instrumentation Engineers

Wu, T., Tay, C.J., Quan, C., Wang, S., Shang, H.M.

SPIE-The International Society for Optical Engineering

Chen, L., Quan, C., Tay, C. J.

SPIE - The International Society of Optical Engineering

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12