Blank Cover Image

Monitoring of Fermi Level Variations at Metal/High-K Interfaces with in situ X-ray Photoelectron Spectroscopy

Author(s):
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. Year:
2006
Page(from):
339
Page(to):
349
Pages:
11
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings XPS/LEIS Study of High-k Rare Earth (Lu, Yb) Oxides Silicates on Si; The Effect of Annealing on Microstructure Evolution

Zenkevich, A., Lebedinskii, Y., Scarel, G, Fanciulli, M

Springer
7 Conference Proceedings Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy

K. Kakushima, K. Okamoto, K. Tachi, S. Sato, J. Song

Electrochemical Society
2 Conference Proceedings Profiling of the SiO2 - SiC Interface Using X-ray Photoelectron Spectroscopy

Ghosh, R.N., Ezhilvalavan, S., Golding, B., Mukhopadhyay, S.M., Mahadev, N., Joshi, P., Das, M.K., Cooper, J.A., Jr.

Materials Research Society
8 Conference Proceedings Can LEIS Spectra Contain Information on Surface Electronic Strcucture of High-K Dielectrics

Lebedinskii, Y, Zenkevich, A, Pushkin, M, Barantsev, N, Troyan, V, Nevolin, V

Springer
3 Conference Proceedings Barrier Height and Fermi Level Pinning at Schottky Interfaces

Patel,K.D., Modi,B.P., Srivastava,R.

Narosa Publishing House
9 Conference Proceedings Electrochemical Oxidation of Pyrite in Alkaline Electrolytes: An Investigation Employing Cyclic Voltammetry, In Situ Scanning Probe Microscopy and Ex Situ X-Ray …

Abraitis, P.K., Brandon, N.P., England, K.E.R., Kelsall, G.H., Lennie, A.R., Pattrick, R.A.D., Vaughan, D.J., Yin, Q.

Electrochemical Society
4 Conference Proceedings Core Level Photoelectron Spectroscopy

WERTHEIM K. G.

D. Reidel Publishing Company
10 Conference Proceedings X-ray Photoelectron Spectroscopy of Metal-Exchanged Na-ZSM-5 Zeolites

Haack, L. P., Hubbard, C. P., Shelef, M.

American Chemical Society
5 Conference Proceedings Valence Band Alignment of Ultra-Thin SiO2/Si Interfaces as Determined by High Resolution X-ray Photoelectron Spectroscopy

Alay, J. L., Fukuda, M., Bjorkman, C. H., Nakagawa, K., Sasaki, S., Yokoyama, S., Hirose, M.

MRS - Materials Research Society
11 Conference Proceedings High-Resolution X-Ray Photoelectron Spectroscopy Study on Si₃N₄/Si Interface Structures and Its Correlation with Hysteresis in C(V) Curves

M. Higuchi, A. Teramoto, M. Komura, S. Shinagawa, E. Ikenaga, H. Nohira, K. Kobayashi, T. Hattori, S. Sugawa, T. Ohmi

Electrochemical Society
6 Conference Proceedings X-ray Photoelectron Spectroscopy Analysis of Metal Stacks after High Density Plasma Etching and Anticorrosion Treatment

Czuprynski, P., Joubert, O., Heitzmann, M.

Electrochemical Society
12 Conference Proceedings INTRODUCTION TO X-RAY PHOTOELECTRON SPECTROSCOPY

Defosse C., Rouxhet G. P.

D. Reidel Publishing Company
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12