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Defects at the High-k/Semiconductor Interfaces Investigated by Spin Dependent Spectroscopies

Author(s):
Fanciulli, M.
Costa, O
Baldovino, S.
Cocco, S.
Seguini, G.
Prati, E.
Scarel, G.
2 more
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. Year:
2006
Page(from):
263
Page(to):
277
Pages:
15
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

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