Forming Gas Annealing of the Carbon PbC Center in Oxidized Porous 3C- and 4H-SiC: An EPR Study

Forming Gas Annealing of the Carbon PbC Center in Oxidized Porous 3C- and 4H-SiC: An EPR Study

Author(s):

Publication title:

Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005

Title of ser.:

Materials science forum

Ser. no.:

527-529

Pub. Year:

2006

Pt.:

2

Page(from):

1015

Page(to):

1018

Pages:

4

Pub. info.:

Stafa-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878494255 [0878494251]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00015830
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Silicon Carbide and Related Materials
Conf. info. (Number):	2005
Conf. info. (Venue):	Pittsburgh, Pennsylvania, USA
Conf. info. (Date):	2005.09.18-2005.09.23

Similar Items:

1 Conference Proceedings Microscopic Structure and Electrical Activity of 4H-SiC/SiO2 Interface Defects : an EPR Study of Oxidized Porous SiC von Bardeleben, H.J., Cantin, J.L., Shishkin, Y., Devaty, R.P., Choyke, W.J. Trans Tech Publications	7 Conference Proceedings Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC Bardeleben, H. J. von, Cantin, J. L., Vickridge, I., Song, Y., Dhar, S., Feldman, L. C., Williams, J. R., Ke, L., … Trans Tech Publications
2 Conference Proceedings EPR Studies of SiCISiO2 Interfaces in n-type 4H-and 6H- Oxidized Porous SIC von Bardeleben, H.J., Cantin, J.L., Mynbaeva, M., Saddow, S.E., Shishkin, Y., Devaty, R.P., Choyke, W.J. Electrochemical Society	8 Conference Proceedings EPR Study of the Defects in Porous Si/SiO x N y and Si0.80Ge0.20/SiGeO2 Cantin, J.L., Schoisswohl, M., von Bardeleben, H.J., Morazzani, V., Ganem, J.-J., Trimaille, I. Electrochemical Society
3 Conference Proceedings EPR Study of Proton Implantation Induced Intrinsic Defects in 6H- and 4H-SiC von Bardeleben, H.J., Cantin, J.L. Trans Tech Publications	9 Conference Proceedings Electron Paramagnetic Resonance Study of Defects at Nitric Oxide Treated Si/SiO2 and Si/Si3N4 Interfaces Cantin, J.L., von Bardeleben, H.-J. Electrochemical Society
4 Conference Proceedings EPR Studies of Interface Defects in n-Type 6H-SiC/SiO2 Using Porous SiC von Bardeleben, H.J., Cantin, J.L., Mynbaeva, M., Saddow, S.E. Trans Tech Publications	10 Conference Proceedings A Combined Photoluminescence aha Electron Paramagnetic Resonance Study of Low Energy Electron Irradiated 4H SiC Sullivan, W., Steeds, J.W., von Bardeleben, H.J., Cantin, J.L. Trans Tech Publications
5 Conference Proceedings Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals Bardeleben, H. J. von, Cantin, J. L., Ke, L., Shishkin, Y., Devaty, R. P., Choyke, W. J. Trans Tech Publications	11 Conference Proceedings RBS-Channeling and EPR Studies of Damage in 2 MeV Al2+_Implanted 6H-SiC Substrates Morilla, Y., Garcia Lopez, J., Battistig, G., Cantin, J. L., Cheang-Wong, J. C., Bardeleben, H. J. von, Respaldiza, M. … Trans Tech Publications
6 Conference Proceedings EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V von Bardeleben, H.J., Cantin, J.L., Reshanov, S.A., Rastegaev, V.P. Trans Tech Publications	12 Conference Proceedings Influence of Oxidation on the Photoluminescence Properties of Porous SiGe Lebib, S., Cantin, J.L., von Bardeleben, H.J., Cernogora, J., Fave, J.L., Roussel, J., Wang, Y.S., Ricolleau, C., … Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12