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Identification of Polytypes in Sublimation Grown 4R-SiC Crystals by High Resolution X-Ray Diffractometry

Author(s):
Dong, J.
Wang, L.
Hu, X.B.
Li, X.X.
Li, J.
Jiang, S.Z.
Chen, X.F.
Xu, X.G.
Jiang, M.H.
4 more
Publication title:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
Title of ser.:
Materials science forum
Ser. no.:
527-529
Pub. Year:
2006
Pt.:
1
Page(from):
451
Page(to):
454
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494255 [0878494251]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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