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Overlapping Shockley/Frank Faults in 4F-SiC PiN Diodes

Author(s):
Twigg, M.E.
Stahlbush, R.E.
Losee, P.A.
Li, C.H.
Bhat, I.B.
Chow, T.P.
1 more
Publication title:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
Title of ser.:
Materials science forum
Ser. no.:
527-529
Pub. Year:
2006
Pt.:
1
Page(from):
383
Page(to):
386
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494255 [0878494251]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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