Characterization of SiC Crystals by Using Deep UV Excitatiotl Raman Spectroscopy

Characterization of SiC Crystals by Using Deep UV Excitatiotl Raman Spectroscopy

Author(s):

Publication title:

Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005

Title of ser.:

Materials science forum

Ser. no.:

527-529

Pub. Year:

2006

Pt.:

1

Page(from):

333

Page(to):

338

Pages:

6

Pub. info.:

Stafa-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878494255 [0878494251]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00015830
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Silicon Carbide and Related Materials
Conf. info. (Number):	2005
Conf. info. (Venue):	Pittsburgh, Pennsylvania, USA
Conf. info. (Date):	2005.09.18-2005.09.23

Similar Items:

1 Conference Proceedings Characterization of Electrical Properties in SiC Crystals by Raman Scattering Spectroscopy T. Kitamura, S. Nakashima, T. Kato, K. Kojima, H. Okumura Trans Tech Publications	7 Conference Proceedings Depth Profiling of Al Ion-Implantation Damage in SiC Crystals by Cathodoluminescence Spectroscopy T. Mitani, R. Hattori, M. Yoshikawa Trans Tech Publications
2 Conference Proceedings Raman Scattering Analyses of Stacking Faults in 3C-SiC Crystals Mitani, T., Nakashima, S., Okumura, H., Nagasawa, H. Trans Tech Publications	8 Conference Proceedings Deep UV Raman Spectroscopy of Epitaxial Graphenes on Vicinal 6H-SiC Substrates S. Kamoi, N. Hasuike, K. Kisoda, H. Harima, K. Morita Trans Tech Publications
3 Conference Proceedings Strueiures of Comets in a Homoepitaxially Grown 4H-SiC Film Studied by DUV Micro-Raman Spectroscopy Tomita, T., Matsuo, S., Okada, T., Kimoto, T., Mitani, T., Nakashima, S. Trans Tech Publications	9 Conference Proceedings Characterization and identification of contraband using UV resonant Raman spectroscopy Lacey,R.J., Hayward,I.P., Sands,H.S., Batchelder,D.N. SPIE-The International Society for Optical Engineering
4 Conference Proceedings Deep UV Excitation Raman Spectroscopy of Homoepitaxial 4H-SiC Films Grown by Microwave Plasma Chemical Vapor Deposition Okamoto, M., Kosugi, R., Nakashima, S., Fukuda, K., Arai, K. Trans Tech Publications	10 Conference Proceedings Impact of UV Irradiation on Thermally Grown 4H-SiC MOS Devices D. Ikeguchi, T. Kirino, S. Mitani, Y. Nakano, T. Nakamura Trans Tech Publications
5 Conference Proceedings Raman Imaging Characterization of Electric Properties of SiC Near a Micropipe Harima, H., Hosoda, T., Nakashima, S. Trans Tech Publications	11 Conference Proceedings Carrier Density Evaluation in P-Type SiC by Raman Scattering Harima, H., Hosoda, T., Nakashima, S. Trans Tech Publications
6 Conference Proceedings Carrier Density Dependence of Fano Type Interference in Raman Spectra of p-type 4H-SiC T. Mitani, S. Nakashima, M. Tomobe, S.Y. Ji, K. Kojima Trans Tech Publications	12 Conference Proceedings Characterization of Silicon Carbide using Raman Spectroscopy Burton, J. C., Long, F. H., Khlebnikov, Y., Khlebnikov, I., Parker, M., Sudarshan, T. S. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12