Tench, R. J., Balooch, M., Connorm A. L., Bernardez, L., Olson, B., Allen, M. J., Siekhaus, W. J., Olander, D. R.
Materials Research Society
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Allen, S.D., Fu, J.M., Surapaneni, Y., Hopkins, A.J., Davis, P.
SPIE-The International Society for Optical Engineering
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Schildback, M. A., Tench, R J., Balooch, M., Siekhaus, W. J.
Materials Research Society
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Calvin Mukarakate, Adam. M Scheer, David. J Robichaud, Robert. W Sykes, Mark. R Nimlos
American Institute of Chemical Engineers
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Balooch, M., Olander, D. R., Siekhaus, W. J.
Materials Research Society
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Calvin Mukarakate, Adam. M Scheer, David. J Robichaud, Robert. W Sykes, Mark. R Nimlos
American Institute of Chemical Engineers
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Balooch, M., Olander, D.R., Russo, R.E., Siekhaus, W.J.
Materials Research Society
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Calvin Mukarakate, Adam. M Scheer, David. J Robichaud, Robert. W Sykes, Mark. R Nimlos
American Institute of Chemical Engineers
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Balooch, M., Olander, D.R., Siekhaus, W.L.
Materials Research Society
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Cricenti. A, Selci. S, Felici. C. A, Generosi. R, Gori. E, Djaczenko. W, Chiarotti. G
Kluwer Academic Publishers
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Steenvoorden M. J. J. R., Weeding L. T., Kistemaker G. P., Boon J. J.
Plenum Press
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Griffey H. R., Greig J. M., Sasmor H., Cummins L. L., Manalili L. S., Gaus J. H.
Kluwer Academic Publishers
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