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Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

Author(s):
Trager-Cowan, Carol
Sweeney, Francis
Wilkinson, A. J.
Trimby, P. W.
Day, A. P.
Gholinia, A.
Schmidt, N. -H.
Parbrook, P. J.
Watson, I. M.
4 more
Publication title:
GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
892
Pub. Year:
2006
Page(from):
677
Page(to):
684
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998469 [1558998462]
Language:
English
Call no.:
M23500/892
Type:
Conference Proceedings

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