Blank Cover Image

Effects of the High-Refractive Index SiN Passivation on AlGaN/GaN HFETs With a Very Low Gate-Leakage Current

Author(s):
Publication title:
GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
892
Pub. Year:
2006
Page(from):
69
Page(to):
76
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998469 [1558998462]
Language:
English
Call no.:
M23500/892
Type:
Conference Proceedings

Similar Items:

Yoshida, Seikoh, Ikeda, Nariaki, Li, Jiang, Wada, Takahiro, Kambayashi, Hiroshi, Takehara, Hironari

Materials Research Society

Yoshida, Seikoh, Ishii, Hirotatsu

Materials Research Society

Yoshida, Seikoh, Ikeda, Nariaki, Li, Jiang, Hataya, Kohji, Wada, Takahiro, Takehara, Hironari

Materials Research Society

Yoshida, Seikoh, Li, Jiang, Wada, Takahiro, Takehara, Hironari

Materials Research Society

Ikeda, Nariaki, Kato, Kazuo, Li, Jiang, Hataya, Kohji, Yoshida, Seikoh

Materials Research Society

S. Yoshida, M. Masuda, Y. Niiyama, J. Li, N. Ikeda

Trans Tech Publications

Yoshida, Seikoh, Li, Jiang, Wada, Takahiro, Takehara, Hironari

Materials Research Society

Yoshida, Seikoh, Ishii, Hirotatsu

Materials Research Society

Birkhahn, Ronald, Gotthold, David, Cauffman, Nathan, Peres, Boris, Yoshida, Seikoh

Materials Research Society

Sreenidhi T., A. Azizur Rahman, Arnab Bhattacharya, Amitava DasGupta, Nandita DasGupta

Materials Research Society

Hiroshi Kambayashi, Yuki Niiyama, Shinya Ootomo, Takehiko Nomura, Masayuki Iwami, Yoshihiro Satoh, Sadahiro Kato, Seikoh …

Materials Research Society

Kuball, M., Uren, M.J., Hayes, J.M., Martin, T., Birbeck, J.C.H., Balmer, R.S., Hughes, B.T.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12