Multichannel Mueller Matrix Analysis of the Evolution of Surface Roughness on Different In-Plane Scales During Polycrystaffine Film Processing

Multichannel Mueller Matrix Analysis of the Evolution of Surface Roughness on Different In-Plane Scales During Polycrystaffine Film Processing

Author(s):

Publication title:

Thin-film compound semiconductor photovoltaics : symposium held March 29-April 1, 2005, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

865

Pub. Year:

2005

Page(from):

3

Page(to):

8

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558998186 [1558998187]

Language:

English

Call no.:

M23500/865

Type:

Conference Proceedings

Details

TDL ID:	ZA00015784
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meeting
Conf. info. (Number):	2005
Conf. info. (Venue):	San Francisco, California, U.S.A.
Conf. info. (Date):	2005.03.29-2005.04.01

Similar Items:

1 Conference Proceedings *SURFACE MICROSTRUCTURAL EVOLUTION OF ULTRATHIN FILMS BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY Collins, R. W., An, Ilsin, Li, Y. M., Wronski, C. R. Materials Research Society	7 Conference Proceedings Real-Time Characterization of Non-Ideal Surfaces and Thin-Film Growth by Advanced Ellipsometric Spectroscopies Collins, R. W., Rovira, P. I., Ferlauto, A. S., Koh, J., An, I., Zapien, J. A., Messier, R., Wronski, C. R. MRS - Materials Research Society
2 Conference Proceedings Transparent Conducting Oxide Sculptured Thin Films for Photovoltaic Applications Podraza, N. J., Chen, Chi, Sainju, D., Ezekoye, O., Horn, M. W., Wronski, C. R., Collins, R. W. Materials Research Society	8 Conference Proceedings SUB-SURFACE EQUILIBRATION OF HYDROGEN WITH THE a-Si:H NETWORK UNDER FILM GROWTH CONDITIONS An, I., Li, Y.M., Wronski, C.R., Collins, R.W. Materials Research Society
3 Conference Proceedings Real Time Analysis of Magnetron-Sputtered Thin-Film CdTe by Multichannel Spectroscopic Effipsometry Li, Jian, Chen, Jie, Zapien, J. A., Prodaza, N. J., Chen, Chi, Drayton, J., Vasko, A., Gupta, A., Wang, S. L., Collins, … Materials Research Society	9 Conference Proceedings (181d) Orientational Ordering and Stress Transmission in Packings of Straight or Curved Spherocylinders with Different Surface Roughness Guang Lu, James Third, Christoph Mueller American Institute of Chemical Engineers
4 Conference Proceedings Characteristics of Different Thickness a-Si:H/Metal Schottky Barrier Cell Structures―Results and Analysis Collins, R. W., Jiao, L., Koval, R., Lu, Z., Wronski, C. R. Materials Research Society	10 Conference Proceedings Analysis of Compositionally and Structurally Graded Si:H and Si₁₋xGex:H Thin Films by Real Time Spectroscopic Ellipsometry Nikolas J. Podraza, Jing Li, Christopher R. Wronski, Mark W. Horn, Elizabeth C. Dickey, Robert W. Collins Materials Research Society
5 Conference Proceedings Study Of The Amorphous-To-Microcrystalline Transition During Silicon Film Growth At Increased Rates: Extensions Of The Evolutionary Phase Diagram Collins, R. W., Ferlauto, A. S., Koval, R. J., Rovira, P. I., Wronski, C. R. Materials Research Society	11 Conference Proceedings Application of Deposition Phase Diagrams for the Optimization of a-Si:H-Based Materials and Solar Cells Collins, R. W., Ferlauto, A. S., Ferreira, G. M., Koh, Joohyun, Chen, Chi, Koval, R. J., Pearce, J. M., Wronski, C. R., … Materials Research Society
6 Conference Proceedings Comparison of Phase Diagrams for vhf and rf Plasma-Enhanced Chemical Vapor Deposition of Si:H Films Ferreira, G.M., Ferlauto, A.S., Pearce, J.M., Wronski, C.R., Ross, C., Collins, R.W. Materials Research Society	12 Conference Proceedings Protocrystalline Si:H p-Type Layers for Maximization of the Open Circuit Voltage in a-Si:H n-i-p Solar Cells Koval, R.J., Chen, Chi, Ferreira, G.M., Ferlauto, A.S., Pearce, J.M., Rovira, P.I., Wronski, C.R., Collins, R.W. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12