CHARACTERIZATION OF GROWTH DEFECTS IN ZnTe SINGLE CRYSTALS

CHARACTERIZATION OF GROWTH DEFECTS IN ZnTe SINGLE CRYSTALS

Author(s):

Zhou, W.

Publication title:

Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

299

Pub. Year:

1994

Page(from):

203

Page(to):

208

Pages:

6

Pub. info.:

Pittsburgh, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781558991958 [1558991956]

Language:

English

Call no.:

M23500/299

Type:

Conference Proceedings

Details

TDL ID:	ZA00015783
Series ID:	PA00000011
Conf. info. (Name):	Symposium on infrared detectors
Conf. info. (Number):	1993
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1993.04.14-1993.04.16

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