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X-RAY DIFFRACTION AND REFLECTANCE, RAMAN SCATTERING AND PHOTOLUMINESCENCE CHARACTERIZATION OF THERMALLY ANNEALED EPITAXIAL Si1-XGeX LAYERS

Author(s):
Libezny, M.
De WoIf, I.
Poortmans, J.
Van Ammel, A.
Caymax, M.
Holy, V.
Vi-da, F.
Kub-na, J.
Werner, K.
Ishida, M.
5 more
Publication title:
Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
298
Pub. Year:
1993
Page(from):
51
Page(to):
56
Pages:
6
Pub. info.:
Pittsburgh, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558991941 [1558991948]
Language:
English
Call no.:
M23500/298
Type:
Conference Proceedings

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