GROWTH AND SURFACE MORPHOLOGY OF THIN SILICON FILMS USING AN ATOMIC FORCE MICROSCOPE

GROWTH AND SURFACE MORPHOLOGY OF THIN SILICON FILMS USING AN ATOMIC FORCE MICROSCOPE

Author(s):

Publication title:

Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

295

Pub. Year:

1993

Page(from):

65

Page(to):

70

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991903 [1558991905]

Language:

English

Call no.:

M23500/295

Type:

Conference Proceedings

Details

TDL ID:	ZA00015779
Series ID:	PA00000011
Conf. info. (Name):	Symposium on atomic-scale imaging of surfaces and interfaces
Conf. info. (Number):	1992
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1992.11.30-1992.12.02

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