Blank Cover Image

LAYERED POLY/AMORPHOUS SILICON DEPOSITION PROCESS FOR IMPROVED SILICIDE INTEGRITY

Author(s):
Publication title:
Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
283
Pub. Year:
1993
Page(from):
647
Page(to):
652
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991781 [1558991786]
Language:
English
Call no.:
M23500/283
Type:
Conference Proceedings

Similar Items:

Cohen, G.M., Cabral, C., Jr., Lavoie, C., Solomon, P.M., Guarini, K.W., Chan, K.K., Roy, R.A.

Materials Research Society

Roy, P.K., Kook, T., Kizilyalli, I.C., Nanda, A.K.

Materials Research Society

Nanda, A. K., Meester, S., Wilkins, C. W.

MRS - Materials Research Society

Roy,P.K., Ma,Y.

SPIE-The International Society for Optical Engineering

Rath, J. K., Hardeman, A. J., Werf, C. H. M. van der, Veenendaal, P. A. T. T. van, Rusche, M. Y. S., Schropp, R. E. I.

Materials Research Society

Cohen, G.M., Cabral, C., Jr., Lavoie, C., Solomon, P.M., Guarini, K.W., Chan, K.K., Roy, R.A.

Materials Research Society

Nallapati,G., Ajmera,P.K.

Narosa Publishing House

Crean, G.M., Cole, P.D., Stoemenos, J.

Materials Research Society

Silva, Ana Neilde Rodrigues da, Furlan, Rogerio, Santiago-Aviles, J. J.

MRS - Materials Research Society

J.A. Stefani, S. Poarch, S. Saxena, P.K. Mozumder

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12