A SIMPLE MODEL FOR STRESS VOIDING IN PASSIVATED THIN FILM CONDUCTORS
- Author(s):
- Publication title:
- Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 265
- Pub. Year:
- 1992
- Page(from):
- 45
- Page(to):
- 50
- Pages:
- 6
- Pub. info.:
- Pittsburgh, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991606 [1558991603]
- Language:
- English
- Call no.:
- M23500/265
- Type:
- Conference Proceedings
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