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DISORDERING AND CHARACTERIZATION STUDIES OF 69 GaAs/71GaAs ISOTOPE SUPERLATTICES STRUCTURES: THE EFFECT OF OUTDIFFUSION OF THE SUBSTRATE DOPANT Si

Author(s):
Tan, T. Y.
You, H. M.
Yu, S.
Goesele, U. M.
Jager, W.
Zypman, F.
Tsu, R.
Lee, S.-T
3 more
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
873
Page(to):
880
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

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