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PHOTOLUMINESCENCE AND PHOTOACOUSTIC SPECTROSCOPY OF SI SINGLE AND MULTI-STEP INGOT - AND WAFER-ANNEALED GaAs CRYSTALS

Author(s):
Ka, O.
Oda, O.
Shigetomi, S.
Ikari, T.
Makita, Y.
Yamada, A.
1 more
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
689
Page(to):
694
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

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