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PASSIVATING COMPLEXES IN Cd DOPED GaAs AND InP: MICROSCOPIC PROPERTIES AND ELCTRICAL EFFECTS

Author(s):
Moriya, N.
Deicher, M.
Kalish, R.
Keller, R.
Magerle, R.
Pfeiffer, W.
Pross, P.
Skudlik, H.
Wichert, Th.
Wolf, H.
Collaboration, Isolde
6 more
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
431
Page(to):
436
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

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