Blank Cover Image

ELECTRON IRRADIATED InP: A POSITION ANNIHILATION STUDY

Author(s):
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
337
Page(to):
342
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Positron Lifetime Investigations of Electron Irradiated InP

Bretagnon,T., Dannefaer,S., Kerr,D.

Trans Tech Publications
7 Conference Proceedings Vacancies in Electron Irradiated 6H-SiC

Friessnegg, T., Dannefaer, S.

MRS - Materials Research Society
2 Conference Proceedings Defects in InP investigated by positron annihilation technique

Bretagnon,T., Dannefaer,S., Kerr,D.

Trans Tech Publications
8 Conference Proceedings Native and electron irradiation induced defects in 6H-SiC

Friessnegg,T., Dannefaer,S.

Trans Tech Publications
3 Conference Proceedings Positron Annihilation in Electron Irradiated Silicon

Mascher,P., Dannefaer,S., Kerr,D.

Trans Tech Publications
9 Conference Proceedings Vacancies in As-Grown and Electron-Irradiated 4H-SiC Epilayers Investigated by Positron Annihilation

Dannefaer, S., Avalos, V., Syvajarvi, M., Yakimova, R.

Trans Tech Publications
4 Conference Proceedings HEAT-TREATMENT INDUCED DEFECTS IN CZ-SILICON

Dannefaer, S., Bretagnon, T., Abdurahman, K., Kerr, D., Hahn, S.

Materials Research Society
10 Conference Proceedings THERMAL TRANFORMATION OF THE ELECTRON-IRRADIATED INDUCED DEFECT INDUCED DEFECT H4 IN p TYPE InP.

BRETAGNON,Th., BASTIDE,G., ROUZEYRE,M.

Trans Tech Publications
5 Conference Proceedings Beyond 106 Count Lifetime Spectra Using Hamamatsu Tubes and Pilot U.

Bretagnon,T., Abdurahman,K., Kerr,D., Dannefaer,S.

Trans Tech Publications
11 Conference Proceedings ANNEALING OF GROWN-IN DEFECTS IN GaAs

Dannefaer, S., Mascher, P., Kerr, D.

Materials Research Society
6 Conference Proceedings DEFECTS IN CZ-SILICON INVESTIGATED BY THE POSITRON ANNIHILATION TEHCNIQUES

Dannefaer, S., Kerr, D.

Materials Research Society
12 Conference Proceedings Shallow Positron Traps in Gallium Arsenide

Dannefaer,S., Mascher,P., Kerr,D.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12