Blank Cover Image

RAPID STRUCTURAL DEFECT MAPPING OF BULK II-VI SEMICONDUCTORS USING WHITE-BEAM SYNCHROTRON TOPOGRAPHY AND X-RAY ROCKING CURVE ANALYSIS.

Author(s):
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
215
Page(to):
222
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings OPTIMIZATION OF MBE OF CdTe/CdTe: REFINEMENT IN STRUCTURAL QUALITY EVALUATION OF MBE GROWN (111) CdTe

Lee, M. B., Fanning, T., Marzio, Di D., Casagrande, L. G., Dudley, M.

Materials Research Society
7 Conference Proceedings SYNCHROTRON TOPOGRAPHIC STUDIES OF THE INFLUENCE OF RAPID THERMAL PROCESSING ON DEFECT STRUCTURES IN SINGLE CRYSTAL SILICON

Dudley, Michael, Wang, Franklin F.Y., Fanning, Thomas, Tolis, Georgios, Wu, Jun, Hodul, David T.

Materials Research Society
2 Conference Proceedings SYNCHROTRON X-RAY TOPOGRAPHY AS A NON-DESTRUCTIVE MONITOR OF DAMAGE ACCOMPANYING IC PROCESSING

Dudley, Michael, Wang, Franklyn F. Y., Fanning, Thomas, Gordon-Smith, David

Materials Research Society
8 Conference Proceedings Studies of Interface Demarcation and Structural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography

Chung, H., Raghothamachar, B., Zhou, W., Dudley, M., Gillies, D. C.

MRS - Materials Research Society
3 Conference Proceedings SYNCHROTRON X-RAY TOPOGRAPHIC STUDY OF THE BEHAVIOR OF DEFECTS IN HIGH CARBON-CONTENT Si WAFERS DURING RTP

Fanning, Thomas, Dudley, Michael, Wang, Franklin F. Y., Gordon-Smith, David

Materials Research Society
9 Conference Proceedings Characterization of Defect Structures in 3C-SiC Single Crystals Using Synchrotron White Beam X-ray Topography

Huang, W., Dudley, M., Fazi, C.

MRS - Materials Research Society
4 Conference Proceedings Correlation of Lifetime Mapping of 4H-SiC Epilayers with Structural Defects Using Synchrotron X-Ray Topography

O.Y. Goue, Y. Yang, J.Q. Guo, B. Raghothamachar, M. Dudley

Trans Tech Publications
10 Conference Proceedings Stress Mapping of SiC Wafers by Synchrotron White Beam X-ray Reticulography

Ning Zhang, Yi Chen, Edward Sanchez, Michael F MacMillan, Michael Dudley

Materials Research Society
5 Conference Proceedings Mapping of Defects in Large-Area Silicon Carbide Wafers via Photoluminescence and its Correlation with Synchrotron White Beam X-Ray Topography

Y. Chen, R. Balaji, M. Dudley, M. Murthy, S.I. Maximenko

Trans Tech Publications
11 Conference Proceedings Characterization of SiC Using Synchrotron White Beam X-Ray Topography

Dudley, M., Huang, X.

Trans Tech Publications
6 Conference Proceedings Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals

Chung,H., Raghothamachar,B., Dudley,M., Larson,D.J.,Jr.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings X-RAY TOPOGRAPHY

Dudley, Michael

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12